The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Feb. 05, 2016
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Masaaki Hara, Tokyo, JP;

Yoshiki Okamoto, Kanagawa, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01); G01B 9/02 (2006.01); G01N 21/45 (2006.01); G01N 21/47 (2006.01); G01N 21/51 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/17 (2013.01); G01B 9/02059 (2013.01); G01B 9/02083 (2013.01); G01B 9/02091 (2013.01); G01N 21/45 (2013.01); G01N 21/4795 (2013.01); G01B 11/0675 (2013.01); G01N 2021/1787 (2013.01); G01N 2021/516 (2013.01); G01N 2201/12 (2013.01);
Abstract

[Solving Means] A signal processing apparatus is a signal processing apparatus for an optical tomographic measurement apparatus that generates measurement light and reference light and measures a tomographic structure of a measurement object on the basis of a signal intensity of interference light between the reference light and return light of the measurement light from the measurement object. An arithmetic unit is configured to calculate a signal intensity of simple reflection among the return light of the measurement light, the simple reflection being one time of reflection at a plurality of layers virtually set in a depth direction from a surface layer side of the measurement object. The arithmetic unit is configured to calculate a signal intensity of multiple reflection on the basis of the signal intensity of the simple reflection, the signal intensity of multiple reflection being a signal intensity of return light generated by being reflected at the plurality of layers three or more times.


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