The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Aug. 06, 2014
Hitachi Metals, Ltd., Tokyo, JP;
Ikuo Okada, Takasago, JP;
Masaki Taneike, Takasago, JP;
Hidetaka Oguma, Takasago, JP;
Yoshitaka Uemura, Takasago, JP;
Daisuke Yoshida, Takasago, JP;
Yoshiyuki Inoue, Takasago, JP;
Masato Itoh, Kitamoto, JP;
Kenichi Yaguchi, Kitamoto, JP;
Tadashi Fukuda, Kitamoto, JP;
Takanori Matsui, Kitamoto, JP;
Hitachi Metals, Ltd., Tokyo, JP;
Abstract
A Ni-based alloy comprises nitrides, of which an estimated largest size is an area-equivalent diameter of 12 μm to 25 μm, the estimated largest size of the nitrides being determined by calculating an area-equivalent diameter D which is defined as D=Ain relation to an area A of a nitride with a largest size among nitrides present in a measurement field of view area Sof an observation of the Ni-based alloy, repeatedly performing this operation for n times corresponding to a measurement field of view number n to acquire n pieces of data of the area-equivalent diameter D, arranging the pieces of data of area-equivalent diameter D in ascending order into D, D, . . . Dto calculate a standardized variable y, plotting the area-equivalent diameter D and the standardized variable yon X and Y axes of an X-Y coordinate system, respectively, to obtain a regression line y=a×D+b (wherein a and b are constants) to calculating ywhere a cross-sectional area to be predicted S is 100 mm, and substituting the obtained value of yinto the regression line to obtain the estimated largest size of the nitrides.