The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Mar. 03, 2014
Genea Limited, Sydney, AU;
Eduardo Vom, Kew, AU;
Simon Davies, Preston, AU;
Adrian Higgins, Kew, AU;
Jasmine Pouladi, Ryde, AU;
Ben Stewart-Steele, Kew, AU;
Simon Spence, Hawthorn, AU;
Genea IP Holdings Pty Limited, Sydney, AU;
Abstract
The present invention relates to the field of testing and evaluation of biological samples and provides an apparatus for cultured samples including at least one independently accessible module adapted for incubating at least one of a number of samples wherein the at least one module is operatively associated with a light source and a movable optical inspection means adapted for motion about a viewing axis through the module to enable a sweeping of viewing area. The invention also provides a method of assessing cultured samples for viability, including the steps of: disposing biological samples in a substantially elliptical arrangement within a culturing chamber of an independently accessible module and imaging individual samples of the substantially elliptical arrangement with optical inspection means driven within an X-Y plane that is normal to a viewing axis through the module to obtain time lapse measurement of development of individual samples.