The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Aug. 04, 2017
Gii Acquisition, Llc, Davisburg, MI (US);
Michael G. Nygaard, Fenton, MI (US);
James W. St. Onge, Bloomfield Hills, MI (US);
Nathan Andrew-Paul Kujacznski, Flint, MI (US);
Laura L. Poletti, Grand Blanc, MI (US);
GII Inspection, LLC, Davisburg, MI (US);
Abstract
Method and system for inspecting a manufactured part supported on an optically-transparent window of a rotary actuator at an inspection station are provided. The window rotatably supports the part in a generally vertical orientation at which a bottom end surface of the part has a position and orientation for optical inspection. An illuminator is configured to illuminate the bottom end surface of the part through the window with radiant energy to obtain reflected radiation signals which are reflected off the bottom end surface of the part. The reflected radiation signals travel through the window. A lens and detector assembly is configured to form a bottom image from the reflected radiation signals at a bottom imaging location below the window and is configured to detect the bottom image. The window is made of a material which is substantially transparent to the radiant energy and the reflected radiation signals.