The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10206586 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 19, 2019

Filed:

Dec. 21, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Kazuhiko Fukutani, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/02 (2006.01); G01N 21/17 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0095 (2013.01); A61B 5/02007 (2013.01); A61B 5/7485 (2013.01); G01N 21/1702 (2013.01); G01N 29/2418 (2013.01); A61B 2576/00 (2013.01); G01N 2291/02466 (2013.01);
Abstract

An apparatus includes a detector to output a signal by detecting an acoustic wave produced by irradiating a specimen with light, and a processor configured to: calculate a first optical characteristic value distribution in the specimen; determine, based on a designation by an operator for the first optical characteristic value distribution, two or more regions of a vessel in the specimen; calculate, by using an initial sound pressure distribution or optical energy absorption density distribution of the two or more regions of the vessel, an average optical constant of a background region which surrounds the two or more regions of the vessel; calculate, by using the average optical constant of the background region, a local fluence distribution in the specimen; and calculate, by dividing the first optical characteristic value distribution by the local fluence distribution, a second optical characteristic value distribution in which the first optical characteristic value distribution is corrected.


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Fukutani, Kazuhiko. (2019). Specimen information acquisition apparatus and method therefor (U.S. Patent No. 10206586). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10206586

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