The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Sep. 10, 2015
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Alexander Viacheslavovich Shcherbakov, Moscow region, RU;
Alexey Dmitrievich Lantsov, Moscow region, RU;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); A61B 5/00 (2006.01); G01B 9/02 (2006.01); A61B 5/024 (2006.01); A61B 5/021 (2006.01); A61B 5/026 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0059 (2013.01); A61B 5/0062 (2013.01); A61B 5/02108 (2013.01); A61B 5/02438 (2013.01); A61B 5/6898 (2013.01); G01B 9/02094 (2013.01); G01B 9/02095 (2013.01); A61B 5/0261 (2013.01);
Abstract
The laser speckle interferometric system includes a memory for storing a measurement result of a correction parameter and models for matching a result of processing the speckle pattern to the parameters of the object and a processor for stabilizing the speckle pattern detected by controlling a condition for detecting the speckle pattern in real time, processing a time-varying function representing a temporal change in the speckle pattern based on the speckle pattern and the parameters and generating data indicating tested parameters.