The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Sep. 29, 2016
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Tong Wu, Shenzhen, CN;

Anjian Li, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/00 (2006.01); H04W 24/10 (2009.01); H04L 5/14 (2006.01); H04W 72/04 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04L 5/14 (2013.01); H04W 72/0453 (2013.01);
Abstract

The present disclosure provides an RRM measurement method and apparatus in a TDD system, so as to resolve a current problem that in a process of an inter-frequency measurement or an inter-RAT measurement in a TDD system, UE cannot perform an RRM measurement on a cell whose TDD uplink-downlink configuration identifier is 0. In embodiments of the present disclosure, UE performs an RRM measurement on a cell whose TDD uplink-downlink configuration identifier is 0 by using a corresponding RRM measurement method according to measurement indication information that is carried in an RRM measurement message delivered by a network device. By means of the technical solutions in the present disclosure, UE can perform an RRM measurement on a cell whose TDD uplink-downlink configuration identifier is 0 by using an RRM measurement method.


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