The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Aug. 03, 2017
Accelink Technologies Co., Ltd., Wuhan, CN;
Shuang Chen, Wuhan, CN;
Liping Sun, Wuhan, CN;
Qianggao Hu, Wuhan, CN;
Yan Chen, Wuhan, CN;
Hui Xie, Wuhan, CN;
Qingyan Yue, Wuhan, CN;
Fei Liang, Wuhan, CN;
Yin Zhang, Wuhan, CN;
Hehui Wu, Wuhan, CN;
Abstract
Embodiments of the present invention relate to method and device for measuring optical signal-to-noise ratio (OSNR). A method for measuring an OSNR of a signal of interest may comprise: obtaining spectrum of the signal of interest, the spectrum including power spectrum density distribution of the signal of interest in a channel bandwidth B; obtaining spectrum of a comparative signal that has the same spectrum characteristics as but different OSNR than the signal of interest, the spectrum including power spectrum density distribution of the comparative signal in the channel bandwidth B; and calculating the OSNR of the signal of interest by using the spectrum of the signal of interest and the spectrum of a comparative signal.