The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Mar. 25, 2014
Applicant:

Sanyo Electric Co., Ltd., Daito-shi, Osaka, JP;

Inventors:

Kouhei Tuduki, Kobe, JP;

Fukui Atsushi, Hyogo, JP;

Taizou Sunano, Moriguchi, JP;

Assignee:

SANYO Electric Co., Ltd., Daito-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/36 (2006.01); H01M 4/38 (2006.01); H01M 4/58 (2010.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
H01M 4/386 (2013.01); H01M 4/366 (2013.01); H01M 4/5825 (2013.01); H01M 10/0525 (2013.01); H01M 2220/30 (2013.01);
Abstract

The invention provides a nonaqueous electrolyte secondary battery having a large battery capacity and excellent charge/discharge cycle characteristics. The nonaqueous electrolyte secondary battery includes a negative electrode including a particulate negative electrode active material (), a positive electrode and a nonaqueous electrolyte. The particulate negative electrode active material () includes a plurality of two-phase regions () in the particle wherein the two-phase regions include a first phase (A) containing silicon and a second phase (B) containing silicon oxide disposed on the periphery of the first phase, the negative electrode active material being such that the ratio of the intensity at 480 cmwavelength to the intensity at 510 cmwavelength in a Raman spectrum obtained by Raman spectroscopy is not more than 0.1 and the ratio of the intensity at 2θ=21.6 to the intensity at 2θ=28.4 in an X-ray diffraction pattern obtained by X-ray diffractometry is not more than 0.1.


Find Patent Forward Citations

Loading…