The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Apr. 17, 2015
Applicant:

Nec Lighting, Ltd., Minato-ku, Tokyo, JP;

Inventor:

Yoshikazu Sakaguchi, Tokyo, JP;

Assignee:

NEC LIGHTING, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/52 (2006.01); G02B 5/02 (2006.01);
U.S. Cl.
CPC ...
H01L 51/5268 (2013.01); G02B 5/0221 (2013.01); G02B 5/0236 (2013.01); G02B 5/0242 (2013.01); H01L 51/524 (2013.01); H01L 51/5206 (2013.01); H01L 2251/5369 (2013.01);
Abstract

To provide a transparent resin layer for use in an organic EL panel, capable of solving a problem with light extraction efficiency caused by the wavelength dependency (wavelength dispersion) of the refractive index of light. A transparent resin layerfor use in an organic EL panel includes: a transparent resin; and first fine particleshaving an average particle diameter from 300 to 50000 nm and second fine particleshaving an average particle diameter from 1 to 300 nm dispersed in the transparent resin, and the fine particles have a function as at least either a light scattering material or a light-dispersing material. Alternatively, a transparent resin layerfor use in an organic EL panel includes a transparent resinhaving an uneven structure, the uneven structure includes first projectionsin which at least either the widths or the heights are from 300 to 1000 nm and second projectionsin which at least either the widths or the heights are from 10 to 300 nm, and at least either the shapes or the sizes of the projections in the uneven structure have no periodicity.


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