The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Apr. 21, 2017
Applicant:

Oclaro Japan, Inc., Sagamihara, Kanagawa, JP;

Inventors:

Hiroshi Hamada, Kanagawa, JP;

Takashi Toyonaka, Kanagawa, JP;

Assignee:

Oclaro Japan, Inc., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G02B 6/32 (2006.01); G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1464 (2013.01); G02B 6/32 (2013.01); G02B 6/4295 (2013.01); H01L 27/14607 (2013.01); H01L 27/14618 (2013.01); H01L 27/14636 (2013.01); G02B 6/4225 (2013.01);
Abstract

Provided is a back illuminated photo detector enabling easy determination of whether or not the radius of a beam spot on a light absorption layer is an appropriate size. The back illuminated photo detector includes: a semiconductor substrate having a first surface for receiving light; a semiconductor layer that is laminated on a second surface and includes a light absorption layer; a passivation film so as to expose a contact portion that is part of an upper surface of the semiconductor layer; and an electrode that is in contact with the semiconductor layer in the contact portion, and has a reflectance lower than that of the passivation film. The contact portion includes a center portion located on an optical axis, and an area of the center portion is smaller than a design cross-sectional area of a beam spot.


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