The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Nov. 01, 2017
Applicant:

Lg Display Co., Ltd., Seoul, KR;

Inventors:

Youngmin Jeong, Paju-si, KR;

Seunghwan Shin, Jeonju-si, KR;

Daeyoung Seo, Incheon, KR;

Soyoung Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); G02F 1/1362 (2006.01); G02F 1/1343 (2006.01);
U.S. Cl.
CPC ...
H01L 27/124 (2013.01); G02F 1/136286 (2013.01); H01L 27/1237 (2013.01); H01L 27/1259 (2013.01); H01L 27/1262 (2013.01); H01L 27/1288 (2013.01); G02F 1/134363 (2013.01); G02F 2001/13629 (2013.01); G02F 2001/136295 (2013.01); G02F 2201/40 (2013.01);
Abstract

A display device is described that has reduced resistance in one or more of the gate, common, data electrical lines that control the operation of the pixels of the display device. Reduced resistance is achieved by forming additional metal and/or metal-alloy layers on the gate, common, and/or data lines in such a manner so that the cross-sectional area of those lines is increased. As a consequence, each such line is formed so as to be thicker than could otherwise be achieving without causing defects in the rubbing process of an alignment layer. Additionally, no widening of these lines is needed, thus preserving the aspect ratio of the device. The gate insulating and semiconducting layers that in part make up the thin film transistors that help control the operation of the pixels of the device may also be designed to take into account the increased thickness of the lines.


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