The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Aug. 02, 2017
Applicant:

Datalogic Ip Tech S.r.l., Lippo di Calderara di Reno, IT;

Inventors:

Francesco D'Ercoli, Bologna, IT;

Marco Cumoli, Monte San Pietro, IT;

Claudio Saporetti, Bologna, IT;

Alessandro Franchi, Bologna, IT;

Assignee:

Datalogic IP Tech S.r.l., Lippo di Calderara di, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/50 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/50 (2013.01); G06K 9/6211 (2013.01);
Abstract

Systems, methods, and computer-readable storage media are provided for identifying (recognizing) an object from its shape in a sequence of images utilizing sequence alignment matrices (SAMs). For a given image, an object is segmented and from the segmented object, a set of key points is extracted. From the extracted key points, a set of local feature descriptors, strictly related to the key points and uniquely ordered in sequence, are extracted. The feature sequence obtained from the segmented object is aligned with a counterpart or reference image (e.g., a model or another image) using a Sequence Alignment Matrix (SAM). A custom scoring technique for the alignment provides a quality index for the identification of the object.


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