The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Jan. 08, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jing Wang, San Jose, CA (US);

Nuo Xu, San Jose, CA (US);

Woosung Choi, Pleasanton, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 17/5036 (2013.01); G06F 17/5081 (2013.01); G06F 2217/10 (2013.01);
Abstract

A computer implemented method for determining performance of a semiconductor device is provided. The method includes providing a technology computer aided design data set corresponding to nominal performance of the semiconductor device, identifying a plurality of process variation sources that correspond to process variations that occur during the manufacturing of the semiconductor device, generating a nominal value look-up table of electrical parameters of the semiconductor device using nominal values of each of the plurality of process variation sources, and generating a plurality of process variation look-up tables of electrical parameters of the semiconductor device using variation values corresponding to each of the plurality of process variation sources that are identified as corresponding to the semiconductor device.


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