The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Dec. 15, 2015
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Jinha Kim, Sunnyvale, CA (US);

Oskar Van Rest, Mountain View, CA (US);

Sungpack Hong, Palo Alto, CA (US);

Hassan Chafi, San Mateo, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30958 (2013.01); G06F 17/30324 (2013.01);
Abstract

Techniques herein optimize subgraph pattern matching. A computer receives a graph vertex array and a graph edge array. Each vertex and each edge has labels. The computer stores an array of index entries and an array of edge label sets. Each index entry corresponds to a respective vertex originating an edge and associates an offset of the edge with an offset of the respective vertex. Each edge label set contains labels of a respective edge. The computer selects a candidate subset of edges originating at a current vertex. The edge labels of each candidate edge of the candidate subset include a same particular query edge labels. The computer selects the candidate subset based on the index array and afterwards selects a result subset of vertices from among the terminating vertices of the candidate edges. The labels of each vertex of the result subset include a same particular query vertex labels.


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