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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10204032 B1

PDFFull Text
Date of Patent:
Feb. 12, 2019

Filed:

Jan. 11, 2017

Generating test data from samples using natural language processing and structure-based pattern determination

Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Janardan Misra, Bangalore, IN;

Milind Savagaonkar, Bangalore, IN;

Neville Dubash, Mumbai, IN;

Sanjay Podder, Thane, IN;

Rashmi Singh, Bijnor, IN;

Venkat Surya, Chennai, TN;

Assignee:

Accenture Global Solutions Limited, Dublin, IE;

Attorney:

Harrity & Harrity, LLP

Primary Examiner:

Qing Chen

Assistant Examiner:

Clint Thatcher

Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01);
Abstract

A method may include receiving a plurality of samples that include textual content. The method may include extracting unit values, corresponding to structural units, from the plurality of samples. The structural units may identify characteristics of the plurality of samples to be used to identify pattern information. The pattern information may identify unit values that are shared between at least two samples of the plurality of samples. The method may include generating one or more structural representations based on the unit values. The one or more structural representations may identify the pattern information. The method may include generating one or more additional samples based on the one or more structural representations. The one or more additional samples may include at least one of the unit values, and may be generated based on the pattern information. The method may include outputting the one or more additional samples.

Find Patent Forward Citations

Misra, Janardan. (2019). Generating test data from samples using natural language processing and structure-based pattern determination (U.S. Patent No. 10204032). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10204032

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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