The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

May. 13, 2015
Applicant:

SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;

Inventors:

Jin Youp Cha, Icheon-si, KR;

Yu Ri Lim, Icheon-si, KR;

Assignee:

Sk hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/08 (2006.01); G11C 17/16 (2006.01); G11C 17/18 (2006.01); G11C 29/02 (2006.01); G06F 11/32 (2006.01);
U.S. Cl.
CPC ...
G06F 11/08 (2013.01); G11C 17/16 (2013.01); G11C 17/18 (2013.01); G11C 29/027 (2013.01);
Abstract

An error detection circuit may include a selection unit that sequentially selects a primary data group and a secondary data group according to a first control signal and generates an output signal; a first operation unit that performs an error detection operation on the output signal and outputs a preliminary error operation signal; a storage unit that latches the preliminary error operation signal and output a latched signal according to a second control signal; a second operation unit that performs an error detection operation on a previous preliminary error operation signal outputted from the storage unit and a current preliminary error operation signal outputted from the first operation unit and generates an internal error operation signal; and a comparison unit that compares the internal error operation signal with an external error operation signal and outputs a result of the comparison as an error detection signal.


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