The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Jun. 20, 2014
Emc Corporation, Hopkinton, MA (US);
Ziye Yang, Shanghai, CN;
Chenhui Fan, Shanghai, CN;
Ping Chen, Shanghai, CN;
Xi Chen, Shanghai, CN;
Hailan Chen, Shanghai, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
The present disclosure relates to a method and apparatus for measuring performance of a storage system. The method comprises: causing one or more entities to execute a task set comprising multiple tasks, each of the multiple tasks being used for accessing the storage system; obtaining an indicator set of the storage system based on a result of the execution, the indicator set comprising one or more indicators for indicating performance of the storage system; and adjusting the task set based on the indicator set, for subsequent execution by the one or more entities. The method can be executed iteratively. By means of the present invention, workloads for the next round's execution can be intelligently improved according to execution results after each round's execution of workloads, so that performance of the storage system can be obtained more pertinently and efficiently so as to better utilize the storage system.