The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Sep. 01, 2011
John A. Escarcega, Scottsdale, AZ (US);
Charles Q. Zhan, Chandler, AZ (US);
Joseph Z. LU, Glendale, AZ (US);
John A. Escarcega, Scottsdale, AZ (US);
Charles Q. Zhan, Chandler, AZ (US);
Joseph Z. Lu, Glendale, AZ (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method includes identifying one of multiple regions in a range where an output (OP) value used to implement a manipulated variable is located. The manipulated variable is associated with an industrial process, and the OP value represents an output of a downstream controller. The method also includes calculating an achievable manipulated variable (MV) limit for the manipulated variable based on the region in which the OP value is located. For example, when the OP value is located in one region, the achievable MV limit could match a user-specified limit or be based on a gain between the OP value and a value of a process variable. When the OP value is located in another region, the achievable MV limit could track the value of the process variable with a gap.