The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Feb. 25, 2016
Applicant:

Ngk Insulators, Ltd., Nagoya, JP;

Inventor:

Motohiro Fukuhara, Nagoya, JP;

Assignee:

NGK Insulators, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 1/00 (2006.01); G01R 31/36 (2006.01); G01R 1/00 (2006.01); H02M 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3658 (2013.01); G01R 31/3648 (2013.01); G01R 31/3679 (2013.01); G01R 1/00 (2013.01); H02J 1/00 (2013.01); H02M 1/00 (2013.01);
Abstract

An apparatus for identifying a position of an abnormality occurred in a secondary battery system includes an information acquisition unit for acquiring information about a module (module information) from among a plurality of modules included in a module series that accommodates a block for which the difference between a block voltage value and a block voltage value after a primary delay has changed so as to exceed a voltage threshold within a preset time before and after the point in time at which the block voltage value and series current value stopped being correlated, a notification reception unit for receiving a notification about the occurrence of an abnormality in a secondary battery, and a module specification unit for specifying at least the module corresponding to the latest module information as the module in which an abnormality occurred when the notification reception unit receives a notification.


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Fukuhara, Motohiro. (2019). Device, method, and non-transitory recording medium storing program for specifying abnormality-occurrence area of secondary battery system (U.S. Patent No. 10203376). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10203376

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