The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Jan. 07, 2013
Applicant:

New York University, New York, NY (US);

Inventor:

Ozgur Sinanoglu, Abu Dhabi, AE;

Assignee:

New York University, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/28 (2013.01); G01R 31/318575 (2013.01); G01R 31/318558 (2013.01);
Abstract

Exemplary systems, methods and computer-readable mediums can assign, from the circuit, at least two scan cells as at least two interface registers, and generate at least one bidirectional scan path between the at least two interface registers of the at least one portion of the circuit. The at least two interface registers can be disposed in neighboring positions, and the assigning can include a partitioning procedure that can iteratively merge the scan cells of the at least one portion of the circuit into a plurality of regions.


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Sinanoglu, Ozgur. (2019). Systems, processes and computer-accessible medium for providing a bi-directional scan path for peak capture power reduction in launch-off-shift testing (U.S. Patent No. 10203368). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10203368

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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