The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2019

Filed:

Oct. 20, 2015
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Giovanni Capodivacca, Padua, IT;

Adolfo De Cicco, Castel d'Azzano, IT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 31/2621 (2013.01); G01R 31/2642 (2013.01); G01R 31/025 (2013.01);
Abstract

A device may include a plurality of cells. Each cell may include a field-effect transistor and a switch configured to selectively connect a second contact of the respective field-effect transistor with a common test line of the device. A controller of the device is configured to control the switch to be in a closed position. At least one pin is provided which is configured to apply a stress voltage to a common power line connected to a first contact with the field-effect transistor and to the common test line.


Find Patent Forward Citations

Capodivacca, Giovanni. (2019). Device testing (U.S. Patent No. 10203365). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10203365

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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