The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
May. 31, 2013
Agilent Technologies, Inc., Loveland, CO (US);
Hiroaki Ugawa, Tokyo, JP;
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
An impedance measurement method is provided having a certain level of measurement sensitivity across all ranges of impedance and capable of covering a wide measurement range. In the method, a device under test (DUT) is connected in series or in parallel to a signal line, a measurement signal is transmitted from a signal source, an input signal ainto the DUT, a reflected signal reflected from the DUT, and a passed signal that passed through the DUT are measured, S-parameters Sand Sare calculated based on respective measured values of the input signal, the reflected signal, and the passed signal, and an impedance Zof the DUT is calculated based on a formula: Z=2ZS/S, where Zis a characteristic impedance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile