The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Apr. 07, 2015
John Weber Schultz, Alpharetta, GA (US);
Rebecca Brockway Schultz, Alpharetta, GA (US);
James Geoffrey Maloney, Marietta, GA (US);
Kathleen Cummings Maloney, Marietta, GA (US);
John Weber Schultz, Alpharetta, GA (US);
Rebecca Brockway Schultz, Alpharetta, GA (US);
James Geoffrey Maloney, Marietta, GA (US);
Kathleen Cummings Maloney, Marietta, GA (US);
Other;
Abstract
Various examples of methods and systems are disclosed for non-contact determination of coating thickness. In one example, among others, a method includes illuminating a surface having a layer of a coating material with electromagnetic (EM) energy transmitted at two or more frequencies, obtaining measured reflection data from reflected EM energy, and matching the measured reflection data to modeled reflection data of a reflection model based upon minimization of an error between the measured reflection data and the modeled reflection data to determine a measured thickness of the layer. In another example, a system includes a probe configured to illuminate an area of the surface including a layer of a coating material with EM energy and receive reflected EM energy, and a processing device configured to determine a measured thickness of the layer based upon minimization of an error between measured reflection data and modeled reflection data.