The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Feb. 25, 2014
United Technologies Corporation, Hartford, CT (US);
Gordon M. Reed, Plantsville, CT (US);
James Romanelli, Colchester, CT (US);
James M. Koonankeil, Marlborough, CT (US);
Kevin J. Klinefelter, Uncasville, CT (US);
Markus W. Fritch, Manchester, CT (US);
Kenneth J. Hollman, Meriden, CT (US);
Jeffrey S. Beattie, South Glastonbury, CT (US);
United Technologies Corporation, Farmington, CT (US);
Abstract
A method is provided for inspecting at least one aperture of a component with curable material and an inspection system. At least a portion of the curable material is injected into the aperture. The curable material conforms to at least a portion the aperture and subsequently cures and forms a mold of at least a portion of the aperture. The mold is removed from the aperture. At least a portion of a geometry of the mold is compared to at least a portion of a geometry of a reference model for the aperture using the inspection system.