The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Sep. 13, 2017
Faramarz Farahi, Charlotte, NC (US);
Gelareh Babaie, Charlotte, NC (US);
Mehrdad Abolbashari, Charlotte, NC (US);
Faramarz Farahi, Charlotte, NC (US);
Gelareh Babaie, Charlotte, NC (US);
Mehrdad Abolbashari, Charlotte, NC (US);
UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE, Charlotte, NC (US);
Abstract
A measurement method and system include illuminating an object to be measured with light at two different wavelengths and an incident angle; capturing an image of the object; detecting a frequency of an interference pattern from the image using Fractional Bi-Spectrum Analysis; and calculating a thickness of the object based on the Fractional Bi-Spectrum Analysis. The thickness is calculated based on a relationship between the thickness and the frequency of the interference pattern. The Fractional Bi-Spectrum Analysis is performed on a linear medium with the two different wavelengths being known.