The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
May. 18, 2012
Brian William Pogue, Hanover, NH (US);
David Joseph Gladstone, Norwich, VT (US);
Scott Christian Davis, Woodsville, NH (US);
Johan Jakob Axelsoon, Lund, SE;
Adam Kenneth Glaser, Lebanon, NH (US);
Rongxiao Zhang, Norwich, VT (US);
Brian William Pogue, Hanover, NH (US);
David Joseph Gladstone, Norwich, VT (US);
Scott Christian Davis, Woodsville, NH (US);
Johan Jakob Axelsoon, Lund, SE;
Adam Kenneth Glaser, Lebanon, NH (US);
Rongxiao Zhang, Norwich, VT (US);
THE TRUSTEES OF DARTMOUTH COLLEGE, Hanover, NH (US);
Abstract
A system for providing monitored radiation therapy has a high energy radiation source, apparatus for excluding uncontrolled ambient light, and apparatus for collecting light emitted from a subject. The system has apparatus for spectrally analyzing the collected light, and a processor for determining oxygenation or other metabolic function of tissue within the subject from spectral analysis of the collected light. The system monitors radiation therapy by providing a beam of high energy radiation; collecting Cherenkov and/or photoluminescent light from the subject, the light generated along the beam; spectrally analyzing the light; and determining oxygenation or metabolic function of tissue from the spectral analysis. Beam profile of the system is calibrated by imaging from multiple angles Cherenkov and/or photoluminescent light emitted by a phantom placed in the beam in lieu of a subject, captured images are analyzed to determine beam profile.