The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Sep. 06, 2017
Amo Wavefront Sciences, Llc, Santa Ana, CA (US);
Daniel R. Neal, Tijeras, NM (US);
Richard J. Copland, Albuquerque, NM (US);
AMO WaveFront Sciences, LLC, Santa Ana, CA (US);
Abstract
An optical measurement system: passes a probe light beam through a variable focal length lens to the retina of an eye, and returns light from the retina through the variable focal length lens to a wavefront sensor; adjusts the focal length of the variable focal length lens to provide a desired characteristic to at least one of: the probe light beam, and the light returned by the retina to the wavefront sensor; passes a calibration light through the variable focal length lens to the wavefront sensor while the variable focal length lens is at the adjusted focal length to ascertain the adjusted focal length; and makes a wavefront measurement of the eye from the light returned from the retina of the eye through the variable focal length lens to the wavefront sensor, and from the adjusted focal length ascertained from the calibration light received by the wavefront sensor.