The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2019
Filed:
Mar. 10, 2017
Applicant:
Haag-streit Ag, Koeniz, CH;
Inventors:
Assignee:
HAAG-STREIT AG, Koeniz, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/113 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/1025 (2013.01); A61B 3/113 (2013.01); G01B 9/02077 (2013.01); G01B 9/02091 (2013.01); G01B 2290/65 (2013.01);
Abstract
In a method for interferometrically capturing measurement points of a region of an eye, a plurality of measurement points are captured by a measurement beam along a trajectory, wherein the same trajectory is passed over by the measurement beam in the region during at least a first iteration and a second iteration. The trajectory of the first iteration is rotated through an angle and/or displaced by a distance in relation to the trajectory of the second iteration in order to obtain a more homogeneous measurement point distribution.