The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Sep. 20, 2016
Applicant:

Ambarella, Inc., Santa Clara, CA (US);

Inventors:

Luyi Sun, Shanghai, CN;

Zhi He, Shanghai, CN;

Assignee:

Ambarella, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 5/217 (2011.01); H04N 5/367 (2011.01); H04N 5/365 (2011.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
H04N 5/367 (2013.01); G06K 9/36 (2013.01); H04N 5/3651 (2013.01); H04N 5/3675 (2013.01); H04N 5/2178 (2013.01);
Abstract

An apparatus includes an interface and a processor. The interface may be configured to receive a plurality of sensed values from a plurality of sensing elements in a sensor. The processor may be connected to the interface and configured to (i) generate a list of a plurality of bad values among said sensed values and (ii) calculate a unique identification value of the sensor based on the bad values. Each of the bad values generally indicates an improper performance of a corresponding one of the sensing elements.


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