The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Sep. 21, 2017
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Jeffrey H. Hunt, Thousand Oaks, CA (US);

John H. Belk, St. Louis, MO (US);

Assignee:

THE BOEING COMPANY, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01); H04N 5/225 (2006.01); B64F 5/60 (2017.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
H04N 5/332 (2013.01); B64F 5/60 (2017.01); G01N 21/8806 (2013.01); G01N 21/95 (2013.01); H04N 5/2256 (2013.01); G01N 2021/8472 (2013.01); G01N 2021/8845 (2013.01); G01N 2201/0683 (2013.01);
Abstract

A system for providing active real-time characterization of an article under test is disclosed. An infrared light source, a first visible light source and a second visible light source each outputs and directs a beam of coherent light at a particular area on the article under test. A visible light camera and a visible light second harmonic generation camera, an infrared camera and an infrared second harmonic generation camera, a sum frequency camera and a third order camera are each configured to receive a respective predetermined return beam of light from the particular area on the article under test. A processor receives signals from the cameras and calculates in real time respective spectroscopic signals and compares each calculated signal with each other calculated signal and with a predetermined baseline signal to ensure that the article under test conforms to an expected value.


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