The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Apr. 12, 2016
International Business Machines Corporation, Armonk, NY (US);
Hong Liang Han, Beijing, CN;
Xin Peng Liu, Beijing, CN;
Bing Dong Ma, Beijing, CN;
Jeremiah S. Swan, Stouffville, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing a composite service is provided. The method may include installing a first debug probe on a first service. The method may include installing a second debug probe on a second service. The method may include executing the composite service, whereby the composite service comprises the first service and the second service. The method may include receiving a first service interaction log and a second service interaction log, whereby the first interaction log records a first plurality of I/O, and whereby the second interaction log records a second plurality of I/O. The method may include generating a global scheduling script based on the first service interaction log and the second interaction log. The method may include sending the first plurality of I/O to the first debug probe and the second plurality of I/O to the second debug probe based on the global scheduling script.