The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Apr. 30, 2015
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Eduardo A. Cuervo Laffaye, Bellevue, WA (US);

David Chiyuan Chu, Redmond, WA (US);

Kaifei Chen, Berkeley, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); G06F 9/50 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 43/08 (2013.01); G06F 9/5044 (2013.01); H04L 67/1002 (2013.01); Y02D 10/22 (2018.01);
Abstract

Nodes of a computing cluster can be selected to run new computing jobs while providing acceptable performance of jobs running on the nodes. Respective performance metrics of respective workloads on respective computing nodes can be determined. Each workload can include a new computing job and the performance metrics can be determined based at least in part on respective measured performance data of the ones of the computing nodes and information of the new computing job. Candidate ones of the computing nodes can be determined based at least in part on the respective performance metrics. One of the candidate computing nodes can be selected based at least in part on the information of the new computing job. In some examples, identification of the new computing job can be transmitted to the selected node. In some examples, state data of the nodes can be updated based on the performance data.


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