The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
May. 19, 2016
Keysight Technologies, Inc., Minneapolis, MN (US);
David L. Gines, Fort Collins, CO (US);
Steven Draving, Colorado, CO (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A measurement instrument and associated method: receive at a first input an aggressor signal (e.g., a supply voltage) from a device under test (DUT); capture samples of the aggressor signal; receive at a second input a victim signal from the DUT, wherein the received victim signal includes jitter induced thereon from the aggressor signal; capture samples of the received victim signal; apply the captured samples of the aggressor signal and the captured samples of the received victim signal to a predetermined model, which represents the jitter induced onto the received victim signal from the aggressor signal, to produce a system of equations; ascertain a plurality of unknown parameters in the predetermined model from the system of equations; and apply the predetermined model with the ascertained parameters to the captured samples of the aggressor signal to estimate the jitter induced onto the received victim signal from the aggressor signal.