The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Jul. 17, 2014
Scienion Ag, Berlin, DE;
Claude Dufresne, East Brunswick, NJ (US);
Holger Eickhoff, Berlin, DE;
Scienion AG, Berlin, DE;
Abstract
A method of electron microscopy imaging of samples, using an electron microscope () having a microscope column () and a transfer device () with a grid carriage (), comprises the steps of preparing multiple samples () on a single electron microscopy grid (), including dispensing the samples () with a dispenser device () on distinct positions on the grid (), introducing the grid () with the transfer device () into the microscope column (), and electron microscopy imaging of the samples (), wherein the preparing step includes holding the grid () on the grid carriage () of the transfer device () or on a grid holder device () provided at the electron microscope () and dispensing the samples () on the grid () while holding it on the grid carriage () or on the grid holder device (). Furthermore, an electron microscope () for electron microscopy imaging of samples is described.