The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Mar. 31, 2017
Applicant:

Facebook Technologies, Llc, Menlo Park, CA (US);

Inventors:

Kieran Tobias Levin, Redwood City, CA (US);

Simon Hallam, San Jose, CA (US);

Ye Yin, Pleasanton, CA (US);

Evan M. Richards, Santa Clara, CA (US);

Shizhe Shen, San Mateo, CA (US);

Assignee:

Facebook Technologise, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G09G 3/20 (2006.01);
U.S. Cl.
CPC ...
G09G 3/2003 (2013.01); G09G 2320/0626 (2013.01); G09G 2320/08 (2013.01);
Abstract

A system calibrates luminance of an electronic display panel. The system includes a luminance detection device, an actuator and a computing device. The luminance detection device comprises a plurality of detectors arranged along a width or length of the electronic display panel to simultaneously measure luminance parameters of at least one row or column of areas in the electronic display panel. Each of the plurality of detectors covers an area in the at least one row or column of the electronic display panel. The actuator is configured to cause a relative translational movement in a length direction or a width direction of the electronic display panel. The computing device is coupled to the luminance detection device to receive the measured luminance parameters, and the computing device is configured to generate calibration data for adjusting brightness of areas of the electronic display panel by processing the measured luminance parameters.


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