The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Dec. 16, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Nicolas Pierre Marie Frederic Bonnier, Cupertino, CA (US);

Anna Wong, Lane Cove, AU;

Clement Fredembach, Ultimo, AU;

Peter Jan Pakulski, Marsfield, AU;

Steven Richard Irrgang, North Ryde, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06T 15/06 (2011.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06T 15/06 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20008 (2013.01);
Abstract

A system and computer-implemented method of altering perceptibility of depth in an image. The method comprises receiving a desired change in the perceptibility of depth in the image; receiving a depth-map corresponding to the image; and determining at least one characteristic of the image. The method further comprises applying an image process to the image, the image process varying in strength according to the depth map, and in accordance with a non-linear predetermined mapping relating a strength of the applied image process to a change in the perceptibility of depth, the mapping being determined with respect to the identified characteristic.


Find Patent Forward Citations

Loading…