The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Mar. 21, 2016
Zhengping Ji, Temple City, CA (US);
Qiang Zhang, Pasadena, CA (US);
Kyoobin Lee, Gyeonggi-do, KR;
Yibing Michelle Wang, Temple City, CA (US);
Hyun Surk Ryu, Gyeonggi-do, KR;
Ilia Ovsiannikov, Studio City, CA (US);
Zhengping Ji, Temple City, CA (US);
Qiang Zhang, Pasadena, CA (US);
Kyoobin Lee, Gyeonggi-do, KR;
Yibing Michelle Wang, Temple City, CA (US);
Hyun Surk Ryu, Gyeonggi-do, KR;
Ilia Ovsiannikov, Studio City, CA (US);
Samsung Electronics Co. Ltd., , KR;
Abstract
An apparatus and a method. The apparatus includes a dynamic vision sensor (DVS) configured to generate a stream of events, where an event includes a location and a binary value indicating a positive or a negative change in luminance; a sampling unit connected to the DVS and configured to sample the stream of events; and an image formation unit connected to the sampling unit and configured to form an image for each sample of the stream of events, wherein a manner of sampling by the sampling unit is adjusted to reduce variations between images formed by the image formation unit.