The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Jan. 13, 2016
International Business Machines Corporation, Armonk, NY (US);
Danny Harnik, Tel Mond, IL;
David Chambliss, Morgan Hill, CA (US);
Oded Margalit, Ramat-Gan, IL;
Dmitry Sotnikov, Rishon-Lezion, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, including partitioning a dataset into a first number of data units, and selecting, based on a sampling ratio, a second number of the data units. A hash value is calculated for each of the selected data units, and a first histogram is computed indicating a first duplication count for each of the calculated hash values. Based on respective frequencies of the calculated hash values, a second histogram is computed indicating an observed frequency for each of the first duplication counts in the first histogram, and based on the sampling ratio and the second histogram, a target function is derived. A third histogram that minimizes the target function is derived, the third histogram including, for the first number of the storage units, second duplication counts and a respective predicted frequency for each of the second duplication counts. Finally, a deduplication ratio is determined based on the third histogram.