The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Sep. 28, 2015
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Timothy Daniel Cole, Seattle, WA (US);

John Michael Morkel, Seattle, WA (US);

Andrew Wayne Ross, Seattle, WA (US);

Tate Andrew Certain, Seattle, WA (US);

Artem Danilov, Kirkland, WA (US);

Christopher Richard Jacques De Kadt, Seattle, WA (US);

Allan Henry Vermeulen, Corvallis, OR (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3684 (2013.01);
Abstract

A test coordinator for an application whose data is to be stored at a journal-based multi-data-store database using an optimistic concurrency control protocol identifies a test descriptor. The test descriptor indicates a particular order of a plurality of events associated with the application's data, such as reads from various data stores and propagations of committed writes from the database journal to the data stores. The test coordinator uses a set of control mechanisms to cause the events to occur in a selected execution environment in the particular order, and stores an indication of a state reached by the application in response to the events.


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