The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Mar. 30, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Man Lv, Beijing, CN;

Chris Zirui Liu, Beijing, CN;

Colin Yong Zou, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/30 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/061 (2013.01); G06F 3/0655 (2013.01); G06F 3/0665 (2013.01); G06F 3/0688 (2013.01); G06F 3/0689 (2013.01); G06F 11/2221 (2013.01); G06F 11/30 (2013.01);
Abstract

Various embodiments of the present disclosure provide a method and apparatus for monitoring health condition of a hard disk by obtaining full-dimensional characteristics associated with the hard disk, wherein the full-dimension characteristics comprise at least two of: hard disk performance information, data integrity information, input/output I/O correctness information, and a hard disk Self-Monitoring Analysis and Reporting Technology S.M.A.R.T. report, and determining the health condition of the hard disk based on the full-dimension characteristics.


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