The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Mar. 06, 2017
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Ying Wang, Fremont, CA (US);

Adam L. Schwartz, Redwood City, CA (US);

Sanjay Mani, Los Altos Hills, CA (US);

Assignee:

SYNAPTICS INCORPORATED, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/14 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); H03K 17/96 (2006.01); B81B 3/00 (2006.01); G06F 3/0354 (2013.01); G01L 9/12 (2006.01); G01L 1/04 (2006.01); G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0418 (2013.01); G06F 3/044 (2013.01); G06F 2203/04105 (2013.01); G06F 2203/04108 (2013.01);
Abstract

Embodiments described herein include a method for calibrating capacitive force sensors. The method includes measuring a force level at each of a first electrode and a second electrode. The method also includes determining an expected force level at the second electrode based on the measured force level at the first electrode and a force contribution ratio for the second electrode. The method includes determining a difference between the measured force level at the second electrode and the expected force level at the second electrode and adjusting a force weighting factor for the second electrode in response to the difference exceeding a predetermined threshold to create an adjusted force weighting factor. The method also includes adjusting the measured force level at the second electrode.


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