The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Apr. 27, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Yoshitaka Nakano, Kokubunji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 17/55 (2006.01); G01K 1/14 (2006.01); H04N 5/225 (2006.01); H04N 7/18 (2006.01); G05D 23/00 (2006.01);
U.S. Cl.
CPC ...
G03B 17/55 (2013.01); G01K 1/14 (2013.01); G05D 23/00 (2013.01); H04N 5/2252 (2013.01); H04N 5/2256 (2013.01); H04N 7/183 (2013.01);
Abstract

An image pickup apparatus which is able to obtain an image with high sharpness within a short period of time using a simple structure when operated in a low-temperature environment. A lens unit and a heater are provided in an internal space of a main case, and the internal space is divided into a first closed space and a second closed space via an opening, which is opened and closed by a valve member. A detecting unit detects a temperature in the internal space. An opening and closing unit opens and closes the valve member. A control unit controls opening and closing actions of the valve member.


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Nakano, Yoshitaka. (2019). Image pickup apparatus resistant to environments, and image monitoring system (U.S. Patent No. 10197892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10197892

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