The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

Oct. 29, 2015
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Hiroyuki Masuda, Chino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
G01S 7/52046 (2013.01); G01S 15/8915 (2013.01); G01S 15/8913 (2013.01);
Abstract

An ultrasonic measurement apparatus includes a transmission processing unit that performs processing for transmitting an ultrasonic wave at a given transmission angle, a reception processing unit that performs reception processing of an ultrasonic echo with respect to a transmitted ultrasonic wave, and a processing unit that performs processing with respect to a reception signal from the reception processing unit. The processing unit obtains a plurality of first resolution signals by synthesizing a plurality of the reception signals based on a first beamforming coefficient, and obtains a second beamforming coefficient for synthesizing a second resolution signal from the plurality of first resolution signals based on whether a signal processing target point belongs to a plane wave propagation region or belongs to a spherical wave propagation region.


Find Patent Forward Citations

Loading…