The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Mar. 25, 2015
Siemens Aktiengesellschaft, Munich, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method is disclosed for recording a parameter map of a target region via a magnetic resonance device. In at least one embodiment, an optimization method is used for the iterative reconstruction of the parameter map. In the optimization method, the deviation of undersampled magnetic resonance data of the target region present in the k-space for different echo times, magnetic resonance data of a portion of the k-space being present in each case for each echo time, is assessed from hypothesis data of a current hypothesis for the parameter map obtained as a function of the parameter from a model for the magnetization. To determine the magnetic resonance data of a portion of the k-space, undersampled raw data is initially acquired within the portions by way of the magnetic resonance device embodied for parallel imaging, and missing magnetic resonance data within the portions is completed by way of interpolation.