The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Nov. 03, 2016
Applicant:
Rieter CZ S.r.o., Usti nad Orlici, CZ;
Inventors:
Assignee:
Rieter CZ s.r.o., Usti nad Orlici, CZ;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/36 (2006.01); B65H 63/06 (2006.01); D01H 13/22 (2006.01); D01H 13/26 (2006.01);
U.S. Cl.
CPC ...
G01N 33/365 (2013.01); B65H 63/06 (2013.01); D01H 13/22 (2013.01); D01H 13/26 (2013.01); B65H 2701/31 (2013.01);
Abstract
A method is provided for adjustment of a textile machine workstation based on yarn parameters measured by an associated yarn quality sensor at the work station. The method generates a first reference value of a selected yarn parameter by measurement of the yarn parameter or by calculation, wherein the first reference value is generated from the yarn parameter for a deliberately defective yarn intentionally produced at the workstation. The method then compares a current value or second reference value of the yarn parameter for yarn produced at the workstation of production quality or higher-than-production quality to the first reference value.