The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Jan. 27, 2016
Applicant:
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Inventor:
Jung Ryul Lee, Daejeon, KR;
Assignee:
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/06 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
G01N 29/069 (2013.01); G01N 29/2418 (2013.01);
Abstract
A system and method for full-field pulse-echo laser ultrasonic propagation imaging is provided. The full-field ultrasonic propagation imaging system generates ultrasounds on a structure by scanning the structure and emitting laser beams, simultaneously senses ultrasounds propagated through thickness of the structure, and generates a through-the-thickness ultrasonic propagation image. Accordingly, the full-field pulse-echo laser ultrasonic propagation imaging can visualize information on through-the-thickness defects in a full field.