The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Nov. 23, 2015
Tsinghua University, Beijing, CN;
Songling Huang, Beijing, CN;
Shen Wang, Beijing, CN;
Wei Zhao, Beijing, CN;
Shisong Li, Beijing, CN;
Zheng Wei, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
Disclosed are a method and a device for testing a defect based on an ultrasonic Lamb wave tomography. The method includes: partitioning an imaging area of a material to be tested into grids; exciting electromagnetic acoustic transducers for emitting to emit Lamb waves with a Amode in all directions, and electromagnetic acoustic transducers for receiving to receive the Lamb waves; obtaining a time-frequency analysis result and recording time-of-flights of testing waves; determining a first slowness of each grid to obtain a first defect area; establishing an extrapolation formula according to the first defect area, and iterating the extrapolation formula to trace and revise paths of the Lamb waves until a better imaging precision is obtained.