The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Feb. 14, 2017
Applicant:
Mettler-toledo Gmbh, Greifensee, CH;
Inventors:
Ingo Andreas Schneider, Cham, CH;
Petr Horn, Valens, CH;
Assignee:
Mettler-Toledo GmbH, Greifensee, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); G01N 27/414 (2006.01); G01N 27/30 (2006.01); G01N 31/22 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4165 (2013.01); G01N 27/414 (2013.01); G01N 27/4148 (2013.01); G01N 27/4167 (2013.01); G01N 27/302 (2013.01); G01N 31/221 (2013.01);
Abstract
ISFET measuring probe with a housing in which an ISFET and a reference electrode are arranged in such a way that the gate electrode of the ISFET, which is coated with an ion-sensitive layer, and the reference electrode reach into a measurement space into which a measurement medium can be introduced, with the distinguishing feature that an auxiliary electrode is arranged additionally inside the housing and is held inside the measurement space.