The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2019
Filed:
Feb. 19, 2015
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Masahiko Ohta, Tokyo, JP;
Jun Takada, Tokyo, JP;
Hiroshi Imai, Tokyo, JP;
Atsushi Hatabu, Tokyo, JP;
Gaku Nakano, Tokyo, JP;
Zhen Wang, Tokyo, JP;
Yuzo Senda, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01N 21/88 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01B 11/16 (2013.01); G01N 21/88 (2013.01);
Abstract
For detecting a crack formed on a structure surface without erroneously, an information processing device that detects a crack on a structure, includes a change detection unit that detects a change in positions of at least two measurement points on the structure; and a crack detection unit that detects a crack based on the change in the positions of the measurement points detected by the change detection unit.